Toshihiko Ochiai
According to our database1,
Toshihiko Ochiai
authored at least 2 papers
in 2013.
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Bibliography
2013
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013
Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013