Toshiharu Asaka
According to our database1,
Toshiharu Asaka
authored at least 3 papers
between 1997 and 2008.
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Bibliography
2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008
2006
Proceedings of the 15th Asian Test Symposium, 2006
1997
H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997