Toshifumi Kobayashi

According to our database, Toshifumi Kobayashi authored at least 6 papers between 1989 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

Detection of CMOS Open Node Defects by Frequency Analysis.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

IEICE Trans. Inf. Syst., 2007

2004

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

IEICE Trans. Inf. Syst., 2004

2003

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

1996

A method of shortening metastable operation duration time by the use of feedback.

Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi

Syst. Comput. Jpn., 1996

1989

A built-in Hamming code ECC circuit for DRAMs.

Kiyohiro Furutani, Kazutami Arimoto, Hiroshi Miyamoto, Toshifumi Kobayashi, Kenichi Yasuda, Koichiro Mashiko

IEEE J. Solid State Circuits, February, 1989