Toral Shah

Masahiro Fujita

J. Electron. Test., 2018

2017

Testing multiple stuck-at faults of ROBDD based combinational circuit design.

[BibT_eX]

[DOI]

Binod Kumar

Masahiro Fujita

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Test pattern generation to detect multiple faults in ROBDD based combinational circuits.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

ROBDD based path delay fault testable combinational circuit synthesis.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits.

[BibT_eX]

[DOI]

Proceedings of the 19th International Symposium on VLSI Design and Test, 2015

Simplification of fully delay testable combinational circuits.

[BibT_eX]

[DOI]

Eugeniy Mitrofanov

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits.

[BibT_eX]

[DOI]

Eugeniy Mitrofanov