Tongshun Liu
Orcid: 0000-0001-6267-1174
According to our database1,
Tongshun Liu
authored at least 3 papers
between 2017 and 2021.
Collaborative distances:
Collaborative distances:
Timeline
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2021
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Bibliography
2021
A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring.
IEEE Trans. Ind. Informatics, 2021
2018
IEEE Trans. Ind. Informatics, 2018
2017
Intelligent robust milling tool wear monitoring via fractal analysis of cutting force.
Proceedings of the 13th IEEE Conference on Automation Science and Engineering, 2017