Ton J. Mouthaan

According to our database, Ton J. Mouthaan authored at least 16 papers between 1994 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Editorial.

Guido Groeseneken, Ingrid De Wolf, A. J. Mouthaan, Jaap Bisschop

Microelectron. Reliab., 2008

CreaTe: A New Programme to Attract Engineers as Design Artists.

Zsófia Ruttkay, Ton J. Mouthaan

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

2006

Internationalisation of Masters education; globalisation at work.

Ton J. Mouthaan, Anke Kohl

Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

2005

A 3-D Circuit Model to evaluate CDM performance of ICs.

M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2005

2004

A Case Study of a Microsystems MSc Curriculum.

Ton J. Mouthaan

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2003

Competence-Based EE-Learning: (How) Can We Implement It?

Ton J. Mouthaan, Wouter Olthuis, Henk Vos

Proceedings of the 2003 International Conference on Microelectronics Systems Education, 2003

2002

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime.

H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.

H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Zapping thin film transistors.

N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan

Microelectron. Reliab., 2002

Competencies of BSc and MSc Programmes in Electrical Engineering and Student Portfolios.

Ton J. Mouthaan, R. W. Brink, Henk Vos

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors.

N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan

Microelectron. Reliab., 2001

Investigations on double-diffused MOS transistors under ESD zap conditions.

Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2001

1996

Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures.

Benno H. Krabbenborg, A. Bosma, Henk C. de Graaff, Ton J. Mouthaan

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

1994

Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices.

Philip B. M. Wolbert, Gerhard K. M. Wachutka, Benno H. Krabbenborg, Ton J. Mouthaan

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994