Tomohito Terasawa

According to our database, Tomohito Terasawa authored at least 8 papers between 2009 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Radio receiver front-end using time-based all-digital ADC (TAD).

Tomohito Terasawa, Yuji Kamiya, Hiroyuki Kawashima, Kenichiro Imai, Masanobu Suzuki, Takamoto Watanabe, Nobuyuki Taguchi, Manabu Sawada, Yu Hou, Yoshiyuki Hirooka, Hong Phuc Ninh, Masaya Miyahara, Akira Matsuzawa

Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

2012

All-digital A/D converter TAD for high-resolution and low-power sensor/RF interface.

Takamoto Watanabe, Tomohito Terasawa

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

All-Digital A/D converter TAD for sensor interface over wide temperature ranges.

Takamoto Watanabe, Hirofumi Isomura, Tomohito Terasawa

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

2010

All-digital TAD-OFDM detection for sensor interface using TAD-digital synchronous detection.

Takamoto Watanabe, Tomohito Terasawa

Proceedings of the 17th IEEE International Conference on Electronics, 2010

An all-digital A/D converter TAD with 4-shift-clock construction for sensor interface in 0.65-μm CMOS.

Takamoto Watanabe, Tomohito Terasawa

Proceedings of the 36th European Solid-State Circuits Conference, 2010

2009

All-Digital Quadrature Detection With TAD for Radio-Controlled Clocks/Watches.

Sumio Masuda, Takamoto Watanabe, Shigenori Yamauchi, Tomohito Terasawa

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

A 0.0027-mm² 9.5-bit 50-MS/s all-digital A/D converter TAD in 65-nm digital CMOS.

Takamoto Watanabe, Shigenori Yamauchi, Tomohito Terasawa

Proceedings of the 16th IEEE International Conference on Electronics, 2009

An all-digital ADC/TDC for sensor interface with TAD architecture in 0.18-µm digital CMOS.

Takamoto Watanabe, Tomohito Terasawa

Proceedings of the 16th IEEE International Conference on Electronics, 2009