Tommaso Foscale

According to our database, Tommaso Foscale authored at least 4 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Exploring trade-offs in multi-site wafer testing.

Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

2023

Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests.

Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

2022

A novel SEU injection setup for Automotive SoC.

Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022