Tomasz Piasecki
Orcid: 0000-0002-3187-1488
According to our database1,
Tomasz Piasecki
authored at least 6 papers
between 2011 and 2024.
Collaborative distances:
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Bibliography
2024
Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties.
Sensors, September, 2024
2019
SIAM J. Math. Anal., 2019
Performance Evaluation of Miniature Integrated Electrochemical Cells Fabricated Using LTCC Technology.
Sensors, 2019
2011
Electrical characterization of aluminium oxide-aluminium thin film composites by impedance spectroscopy.
Microelectron. Reliab., 2011
Microelectron. Reliab., 2011