Tomás Palacios
Affiliations:- Massachusetts Institute of Technology, Cambridge, USA
According to our database1,
Tomás Palacios
authored at least 26 papers
between 2006 and 2024.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2017, "For contributions to gallium nitride electron devices and two-dimensional materials".
Timeline
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Bibliography
2024
Proceedings of the Device Research Conference, 2024
GaN E-mode Complementary Transistors Based on a GaN-on-Si Platform Operational at 350°C.
Proceedings of the Device Research Conference, 2024
A 0.7cm<sup>2</sup> 3.5GHz, -31 dBm Sensitivity Batteryless 5G Energy Harvester Backscattering Chip for Asset Identification in IoT-Enabled Warehouses.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2024
2023
Towards DTCO in High Temperature GaN-on-Si Technology: Arithmetic Logic Unit at 300 °C and CAD Framework up to 500 °C.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Proceedings of the Device Research Conference, 2023
2022
Digital Fabrication of Pneumatic Actuators with Integrated Sensing by Machine Knitting.
Proceedings of the CHI '22: CHI Conference on Human Factors in Computing Systems, New Orleans, LA, USA, 29 April 2022, 2022
2021
Small-Signal, High Frequency Performance of Vertical GaN FinFETs with fmax = 5.9 GHz.
Proceedings of the Device Research Conference, 2021
Proceedings of the Device Research Conference, 2021
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 2021
Proceedings of the CHI '21: CHI Conference on Human Factors in Computing Systems, 2021
2020
Proceedings of the 2020 Device Research Conference, 2020
Proceedings of the 2020 Device Research Conference, 2020
Proceedings of the 2020 Device Research Conference, 2020
Proceedings of the 2020 Device Research Conference, 2020
2018
Sensors, 2018
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments.
Microelectron. Reliab., 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
IEEE J. Solid State Circuits, 2017
2015
Trapping characteristics and parametric shifts in lateral GaN HEMTs with SiO2/AlGaN gate stacks.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2013
Emerging graphene-based electronic & photonic devices, circuits, and systems [Scannning the Issue].
Proc. IEEE, 2013
2012
A new GaN HEMT nonlinear model for evaluation and design of 1-2 watt power amplifiers.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2010
A model for the critical voltage for electrical degradation of GaN high electron mobility transistors.
Microelectron. Reliab., 2010
2006
Review of Recent Developments in Growth of AlGaN/GaN High-Electron Mobility Transistors on 4H-SiC by Plasma-Assisted Molecular Beam Epitaxy.
IEICE Trans. Electron., 2006