Tom Lin

According to our database, Tom Lin authored at least 2 papers between 2005 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Tracking Performance Portability on the Yellow Brick Road to Exascale.

Tom Deakin, Andrei Poenaru, Tom Lin, Simon McIntosh-Smith

Proceedings of the IEEE/ACM International Workshop on Performance, 2020

2005

Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models.

Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin

Microelectron. Reliab., 2005