Tom Jeleniewski

According to our database, Tom Jeleniewski authored at least 9 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Automated PDDL Domain File Generation for Enhancing Production System Development based on SysML Models.

Hamied Nabizada, Tom Jeleniewski, Lasse Beers, Felix Gehlhoff, Alexander Fay

Proceedings of the International Workshop on Artificial Intelligence for Climate Change, 2024

Semantic Capability Model for the Simulation of Manufacturing Processes.

Jonathan Tobias Reif, Tom Jeleniewski, Aljosha Köcher, Tim Frerich, Felix Gehlhoff, Alexander Fay

Proceedings of the 16th International Joint Conference on Knowledge Discovery, 2024

Chatbot-Based Ontology Interaction Using Large Language Models and Domain-Specific Standards.

Jonathan Tobias Reif, Tom Jeleniewski, Milapji Singh Gill, Felix Gehlhoff, Alexander Fay

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

Model-Based Workflow for the Automated Generation of PDDL Descriptions.

Hamied Nabizada, Tom Jeleniewski, Felix Gehlhoff, Alexander Fay

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

Parameter Interdependencies in Knowledge Graphs for Manufacturing Processes.

Tom Jeleniewski, Jonathan Tobias Reif, Felix Gehlhoff, Alexander Fay

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

2023

A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing.

Tom Jeleniewski, Hamied Nabizada, Jonathan Tobias Reif, Aljosha Köcher, Alexander Fay

Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

An Approach to Automating the Generation of Process Simulation Sequences.

Jonathan Tobias Reif, Tom Jeleniewski, Alexander Fay

Proceedings of the 28th IEEE International Conference on Emerging Technologies and Factory Automation, 2023

Integrating Interdependencies in Semantic Manufacturing Process Description Models.

Tom Jeleniewski, Jonathan Tobias Reif, Alexander Fay

Proceedings of the 28th IEEE International Conference on Emerging Technologies and Factory Automation, 2023

2021

A Method to Automatically Generate Semantic Skill Models from PLC Code.

Aljosha Köcher, Tom Jeleniewski, Alexander Fay

Proceedings of the IECON 2021, 2021