Tobias Faller

According to our database, Tobias Faller authored at least 9 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

CaDiCaL 2.0.

Armin Biere, Tobias Faller, Katalin Fazekas, Mathias Fleury, Nils Froleyks, Florian Pollitt

Proceedings of the Computer Aided Verification - 36th International Conference, 2024

2023

Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT.

Nikolaos Ioannis Deligiannis, Tobias Faller, Riccardo Cantoro, Tobias Paxian, Bernd Becker, Matteo Sonza Reorda

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

Constraint-Based Automatic SBST Generation for RISC-V Processor Families.

Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker

Proceedings of the IEEE European Test Symposium, 2023

Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing.

Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the IEEE European Test Symposium, 2023

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.

Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric

Proceedings of the IEEE European Test Symposium, 2023

Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors.

Nikolaos Ioannis Deligiannis, Tobias Faller, Iacopo Guglielminetti, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Using Formal Methods to Support the Development of STLs for GPUs.

Nikolaos Ioannis Deligiannis, Tobias Faller, Josie E. Rodriguez Condia, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Towards SAT-Based SBST Generation for RISC-V Cores.

Tobias Faller, Philipp Scholl, Tobias Paxian, Bernd Becker

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Tobias Faller, Tobias Paxian, Bernd Becker, Matteo Sonza Reorda

Proceedings of the 30th IEEE Asian Test Symposium, 2021