Ting-Pu Tai

According to our database, Ting-Pu Tai authored at least 10 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs.

Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai

Proceedings of the IEEE International Test Conference, 2022

2017

Automotive semiconductor test.

Steve Pateras, Ting-Pu Tai

Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

2015

Diagnosis and Layout Aware (DLA) Scan Chain Stitching.

Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan

IEEE Trans. Very Large Scale Integr. Syst., 2015

Diagnosing timing related cell internal defects for FinFET technology.

Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke

Proceedings of the VLSI Design, Automation and Test, 2015

2010

Test cycle power optimization for scan-based designs.

Kun-Han Tsai, Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli

Proceedings of the 2011 IEEE International Test Conference, 2010

Case study of scan chain diagnosis and PFA on a low yield wafer.

Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns.

Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Customized Algorithms for High Performance Memory Test in Advanced Technology Node.

Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Faster defect localization in nanometer technology based on defective cell diagnosis.

Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann

Proceedings of the 2007 IEEE International Test Conference, 2007