Ting An

According to our database, Ting An authored at least 16 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Nondestructive Testing and Visualization of Catechin Content in Black Tea Fermentation Using Hyperspectral Imaging.

Chunwang Dong, Chongshan Yang, Zhongyuan Liu, Rentian Zhang, Peng Yan, Ting An, Yan Zhao, Yang Li

Sensors, 2021

2020

Embryonics Based Phased Array Antenna Structure With Self-Repair Ability.

Sai Zhu, Chunhui Han, Yafeng Meng, Jiawen Xu, Ting An

IEEE Access, 2020

2019

Feasibility and Reliability Analysis of LCC DC Grids and LCC/VSC Hybrid DC Grids.

Gen Li, Jun Liang, Tibin Joseph, Ting An, Jingjing Lu, Marcio Szechtman, Bjarne R. Andersen, Qikai Zhuang

IEEE Access, 2019

2017

Application of Genetic Algorithm Based on F-Ratio Rule in Signal Feature Selection.

Ting An

Proceedings of the 10th International Symposium on Computational Intelligence and Design, 2017

2015

Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method.

Ting An, Kaikai Liu, Hao Cai, Lirida A. B. Naviner

Microelectron. Reliab., 2015

2014

Architectures of self-controllable digital operators. (Architectures d'opérateurs numérique auto-contrôlables).

Ting An

PhD thesis, 2014

Efficient implementation for accurate analysis of CED circuits against multiple faults.

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner

Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014

Analytical method for reliability assessment of concurrent checking circuits under multiple faults.

Ting An, Kaikai Liu, Lirida Alves de Barros Naviner

Proceedings of the 37th International Convention on Information and Communication Technology, 2014

Simulation study of aging in CMOS binary adders.

Ting An, Hao Cai, Lirida Alves de Barros Naviner

Proceedings of the 37th International Convention on Information and Communication Technology, 2014

2013

Evaluation of fault-tolerant composite field AES S-boxes under multiple transient faults.

Ting An, Lirida Alves de Barros Naviner, Philippe Matherat

Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013

Modeling of transient faults and fault-tolerant design in nanoelectronics.

Tian Ban, Jianxin Wang, Ting An, Lirida A. B. Naviner

Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

A general cost-effective design structure for probabilistic-based noise-tolerant logic functions in nanometer CMOS technology.

Kaikai Liu, Ting An, Hao Cai, Lirida A. B. Naviner, Jean-François Naviner, Hervé Petit

Proceedings of Eurocon 2013, 2013

Reliability analysis of combinational circuits with the influences of noise and single-event transients.

Kaikai Liu, Hao Cai, Ting An, Lirida A. B. Naviner, Jean-François Naviner, Hervé Petit

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

A low cost reliable architecture for S-Boxes in AES processors.

Ting An, Lirida Alves de Barros Naviner, Philippe Matherat

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Parallel scaling-free and area-time efficient CORDIC algorithm.

Matteo Causo, Ting An, Lirida Alves de Barros Naviner

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

Transient fault analysis of CORDIC processor.

Ting An, Matteo Causo, Lirida Alves de Barros Naviner, Philippe Matherat

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012