Timothy D. Sullivan

According to our database, Timothy D. Sullivan authored at least 5 papers between 1995 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Application of three-parameter lognormal distribution in EM data analysis.

Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan

Microelectron. Reliab., 2006

2004

Reliability challenges for copper interconnects.

Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami

Microelectron. Reliab., 2004

2003

Early reliability assessment by using deep censoring.

Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan

Microelectron. Reliab., 2003

1996

IBM experiments in soft fails in computer electronics (1978-1994).

James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus

IBM J. Res. Dev., 1996

1995

Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines.

Chao-Kun Hu, Kenneth P. Rodbell, Timothy D. Sullivan, Kim Y. Lee, Dennis P. Bouldin

IBM J. Res. Dev., 1995