Tim Wood

According to our database, Tim Wood authored at least 8 papers between 1999 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Maximizing scan pin and bandwidth utilization with a scan routing fabric.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the IEEE International Test Conference, 2017

2016

Toward more efficient scan data bandwidth utilization on modern SOCs.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2008

The Test Features of the Quad-Core AMD Opteron- Microprocessor.

Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja

Proceedings of the 2008 IEEE International Test Conference, 2008

Platform Independent Test Access Port Architecture.

Arie Margulis, David Akselrod, Tim Wood, Sopho Metsis

Proceedings of the 2008 IEEE International Test Conference, 2008

2005

Position statement: "have we overcome the challenges associated with SoC and multi-core testing?".

Tim Wood

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2000

Conversion of small functional test sets of nonscan blocks to scan patterns.

Don E. Ross, Tim Wood, Grady Giles

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

A seventh-generation x86 microprocessor.

Michael Golden, Steve Hesley, Alisa Scherer, Matthew Crowley, Scott C. Johnson, Stephan Meier, Dirk Meyer, Jerry D. Moench, Stuart F. Oberman, Hamid Partovi, Fred Weber, Scott White, Tim Wood, John Yong

IEEE J. Solid State Circuits, 1999

The test and debug features of the AMD-K7 microprocessor.

Timothy J. Wood

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999