Tilo Brodbeck

According to our database, Tilo Brodbeck authored at least 5 papers between 2007 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Do ESD fails in systems correlate with IC ESD robustness?

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner

Microelectron. Reliab., 2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

CDM tests on interface test chips for the verification of ESD protection concepts.

Tilo Brodbeck, Kai Esmark, Wolfgang Stadler

Microelectron. Reliab., 2009

2007

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.

Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler

Microelectron. Reliab., 2007

Experience in HBM ESD testing of high pin count devices.

Tilo Brodbeck, Reinhold Gaertner

Microelectron. Reliab., 2007