Tianmei Li

According to our database, Tianmei Li authored at least 19 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Interactive Prognosis Framework Between Deep Learning and a Stochastic Process Model for Remaining Useful Life Prediction.

Hong Pei, Xiaosheng Si, Tianmei Li, Zhengxin Zhang, Yaguo Lei

IEEE Trans. Neural Networks Learn. Syst., December, 2024

Remaining useful life prediction for stochastic degrading devices incorporating quantization.

Jian-Xun Zhang, Jia-Ling Zhang, Zheng-Xin Zhang, Tian-Mei Li, Xiao-Sheng Si

Reliab. Eng. Syst. Saf., 2024

2023

Prognosis for stochastic degrading systems with massive data: A data-model interactive perspective.

Tianmei Li, Hong Pei, Xiaosheng Si, Yaguo Lei

Reliab. Eng. Syst. Saf., September, 2023

Bayesian Deep-Learning-Based Prognostic Model for Equipment Without Label Data Related to Lifetime.

Hong Pei, Xiao-Sheng Si, Changhua Hu, Tianmei Li, Chuan He, Zhenan Pang

IEEE Trans. Syst. Man Cybern. Syst., 2023

2022

Nonlinear degradation modeling and prognostics: A Box-Cox transformation perspective.

Xiao-Sheng Si, Tianmei Li, Jianxun Zhang, Yaguo Lei

Reliab. Eng. Syst. Saf., 2022

2021

An adaptive prognostics method for fusing CDBN and diffusion process: Application to bearing data.

Hong Pei, Xiao-Sheng Si, Chang-Hua Hu, Jian-Fei Zheng, Tianmei Li, Jianxun Zhang, Zhenan Pang

Neurocomputing, 2021

Optimal replacement of degrading components: a control-limit policy.

Xiaosheng Si, Tianmei Li, Qi Zhang

Sci. China Inf. Sci., 2021

A joint order-replacement policy for deteriorating components with reliability constraint.

Xiaosheng Si, Changhua Hu, Tianmei Li, Qi Zhang

Sci. China Inf. Sci., 2021

A New Missing Data Generation Method Based on An Improved DCGAN With Application to RUL Prediction.

Shengfei Zhang, Tianmei Li, Xiaosheng Si, Changhua Hu, Hao Zhang, Yuzhe Ma

Proceedings of the CAA Symposium on Fault Detection, 2021

Sneak circuit analysis considering component performance degradation under digital twin model.

Yuzhe Ma, Tianmei Li, Xiaosheng Si, Changhua Hu, Shengfei Zhang, Hao Zhang

Proceedings of the CAA Symposium on Fault Detection, 2021

2020

Prognostics for Linear Stochastic Degrading Systems With Survival Measurements.

Xiaosheng Si, Tian-Mei Li, Qi Zhang, Changhua Hu

IEEE Trans. Ind. Electron., 2020

An Adaptive Maintenance Policy With Nonlinear Degradation Modeling Based on Prognostic Information.

Jian-Fei Zheng, Hanxiao Mu, Xuanjun Wang, Tian-Mei Li, Qi Zhang, Xi Wang

IEEE Access, 2020

NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction.

Tianmei Li, Xiaosheng Si, Zonghao Yang, Hong Pei, Yuzhe Ma

IEEE Access, 2020

A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction.

Tianmei Li, Hong Pei, Zhenan Pang, Xiaosheng Si, Jian-Fei Zheng

IEEE Access, 2020

2019

A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements.

Xiaosheng Si, Tianmei Li, Qi Zhang

IEEE Trans. Reliab., 2019

2018

An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals.

Xiaosheng Si, Tianmei Li, Qi Zhang, Xiaoxiang Hu

IEEE Trans. Reliab., 2018

2017

An Integrated Reliability Estimation Approach With Stochastic Filtering and Degradation Modeling for Phased-Mission Systems.

Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li

IEEE Trans. Cybern., 2017

2016

A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function.

Chenxu Zhao, Krishna R. Pattipati, Guanjun Liu, Jing Qiu, Kehong Lv, Tianmei Li

IEEE Trans. Syst. Man Cybern. Syst., 2016

Planning Repeated Degradation Testing for Products With Three-Source Variability.

Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu

IEEE Trans. Reliab., 2016