Tiago R. Balen

According to our database, Tiago R. Balen authored at least 53 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits.

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation.

Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

2023

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

J. Electron. Test., August, 2023

Pseudosymmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications.

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago Roberto Balen

IEEE Trans. Aerosp. Electron. Syst., April, 2023

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits.

Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen

Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023

2022

Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC.

Rodrigo N. Wuerdig, Bruno Canal, Tiago R. Balen, Sergio Bampi

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Time Assisted SAR ADC with Bit-guess and Digital Error Correction.

Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool.

Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method.

Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Hybrid Comparator and Window Switching Scheme for low-power SAR ADC.

Bruno Canal, Hamilton Klimach, Sergio Bampi, Tiago R. Balen

Proceedings of the 13th IEEE Latin America Symposium on Circuits and System, 2022

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen

J. Electron. Test., 2021

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators.

Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen

J. Electron. Test., 2020

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.

Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

J. Electron. Test., 2020

Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology.

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020

Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier.

Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen

Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020

Influence of sampling frequency on TID response of SAR ADCs.

Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

J. Electron. Test., 2019

Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC.

Luiz G. S. Dias, Carlos J. González, Fernando J. Boeira, Tiago R. Balen

Proceedings of the IEEE Latin American Test Symposium, 2019

A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects.

Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Single event transient effects on charge redistribution SAR ADCs.

Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen

Microelectron. Reliab., 2017

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs.

Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen

Proceedings of the VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things, 2017

Analyzing the behavior of FinFET SRAMs with resistive defects.

Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

Evaluation of a mixed-signal design diversity system under radiation effects.

Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Low cost automatic test vector generation for structural analog testing.

André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

2016

Radiation Effects in Low Power and Ultra-Low Power Voltage References.

Daniel Fusco, Tiago R. Balen

J. Low Power Electron., 2016

Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry.

Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the 17th Latin-American Test Symposium, 2016

Study of layout extraction accuracy on W/L estimation of ELT in analog design flow.

Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the IEEE 7th Latin American Symposium on Circuits & Systems, 2016

2015

Exploring design diversity redundancy to improve resilience in mixed-signal systems.

Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen

Microelectron. Reliab., 2015

Testing fully differential amplifiers using common mode feedback circuit: A case study.

Isis D. Bender, Guilherme Schwanke Cardoso, Arthur C. de Oliveira, Lucas C. Severo, Alessandro Girardi, Tiago R. Balen

Proceedings of the IEEE 6th Latin American Symposium on Circuits & Systems, 2015

2014

Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects.

Alisson J. C. Lanot, Tiago R. Balen

Proceedings of the 27th Symposium on Integrated Circuits and Systems Design, 2014

Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution.

Alisson J. C. Lanot, Tiago R. Balen

Proceedings of the 15th Latin American Test Workshop, 2014

Design diversity redundancy with spatial-temporal voting applied to data acquisition systems.

Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen

Proceedings of the 15th Latin American Test Workshop, 2014

2013

Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC.

Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2013

2012

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.

Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez

Proceedings of the 13th Latin American Test Workshop, 2012

2011

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.

Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider, Renato V. B. Henriques

J. Electron. Test., 2011

Investigating the effects of transient faults in Programmable Capacitor Arrays.

Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski

Proceedings of the 12th Latin American Test Workshop, 2011

2010

Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 23rd Annual Symposium on Integrated Circuits and Systems Design, 2010

Diversity TMR: Proof of concept in a mixed-signal case.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 11th Latin American Test Workshop, 2010

Radiation effects on programmable analog devices and mitigation techniques.

Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 15th European Test Symposium, 2010

2009

Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors.

Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth

Proceedings of the 10th Latin American Test Workshop, 2009

2007

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

J. Electron. Test., 2007

Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation.

Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), 2007

2006

Functional Test of Field Programmable Analog Arrays.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

Built-in self-test of global interconnects of field programmable analog arrays.

Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell

Microelectron. J., 2005

Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks.

Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell

J. Electron. Test., 2005

Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays.

Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2004

An Approach to the Built-In Self-Test of Field Programmable Analog Arrays.

Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.

Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004