Thomas Schweinböck

According to our database, Thomas Schweinböck authored at least 8 papers between 2003 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Determination of doping type by calibrated capacitance scanning microwave microscopy.

Sören Hommel, Nicole Killat, A. Altes, Thomas Schweinböck, Franz Kreupl

Microelectron. Reliab., 2017

2016

Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale.

Sören Hommel, Nicole Killat, Andreas Altes, Thomas Schweinböck, Doris Schmitt-Landsiedel, Marco Silvestri, Oliver Haeberlen

Microelectron. Reliab., 2016

2014

Quantitative Scanning Microwave Microscopy: A calibration flow.

Thomas Schweinböck, Sören Hommel

Microelectron. Reliab., 2014

2008

Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling.

Roland Biberger, Guenther Benstetter, Thomas Schweinböck, Peter Breitschopf, Holger Goebel

Microelectron. Reliab., 2008

2004

New trends in the application of Scanning Probe Techniques in Failure Analysis.

Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter

Microelectron. Reliab., 2004

2D Dopant Profiling on 4H Silicon Carbide P⁺N Junction by Scanning Capacitance and Scanning Electron Microscopy.

Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner

Microelectron. Reliab., 2004

AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis.

Günther Benstetter, Peter Breitschopf, Werner Frammelsberger, Heiko Ranzinger, Peter Reislhuber, Thomas Schweinböck

Microelectron. Reliab., 2004

2003

Characterization of thin and ultra-thin SiO₂ films and SiO₂/Si interfaces with combined conducting and topographic atomic force microscopy.

Werner Frammelsberger, Guenther Benstetter, Thomas Schweinböck, Richard J. Stamp, Janice Kiely

Microelectron. Reliab., 2003