Thomas S. Barnett

According to our database, Thomas S. Barnett authored at least 8 papers between 2001 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2006

Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction.

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh

IEEE Des. Test Comput., 2006

2003

Extending integrated-circuit yield-models to estimate early-life reliability.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

IEEE Trans. Reliab., 2003

Relating Yield Models to Burn-In Fall-Out in Time.

Thomas S. Barnett, Adit D. Singh

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction.

Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model.

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Estimating burn-in fall-out for redundant memory.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001