Thomas Noulis
Orcid: 0000-0002-1867-7488
According to our database1,
Thomas Noulis
authored at least 23 papers
between 2007 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
Integr., January, 2024
MORCIC: Model Order Reduction Techniques for Electromagnetic Models of Integrated Circuits.
CoRR, 2024
Proceedings of the 20th International Conference on Synthesis, 2024
Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024
Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024
2023
Sensors, April, 2023
Integr., 2023
CMOS Noise Analysis and Simulation From Low Frequency and Baseband to RF and Millimeter Wave.
IEEE Access, 2023
Proceedings of the 12th International Conference on Modern Circuits and Systems Technologies, 2023
Proceedings of the 12th International Conference on Modern Circuits and Systems Technologies, 2023
Proceedings of the IEEE International Conference on Industrial Technology, 2023
2022
Sensors, 2022
Machine Learning based Power Converter Large Signal Simulation for Energy Harvesting Applications.
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the 11th International Conference on Modern Circuits and Systems Technologies, 2022
Chip-Package-Board codesign Methodology for Energy Harvesting DC-DC Boost Converters.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022
2016
Proceedings of the 39th International Conference on Telecommunications and Signal Processing, 2016
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
2008
IEEE Trans. Circuits Syst. I Regul. Pap., 2008
Int. J. Circuit Theory Appl., 2008
IET Circuits Devices Syst., 2008
2007
VLSI Design, 2007
Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions.
Microelectron. Reliab., 2007