Thomas Jacquet

According to our database, Thomas Jacquet authored at least 3 papers between 2015 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.

C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux

Microelectron. Reliab., 2017

2016

Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.

C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Boeck, Klaus Aufinger

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.

Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux

Microelectron. Reliab., 2015