Thomas Fairbanks

According to our database, Thomas Fairbanks authored at least 1 paper in 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2014

Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS.

Robert Pawlowski, Joseph Crop, Minki Cho, James W. Tschanz, Vivek De, Thomas Fairbanks, Heather Quinn, Shekhar Borkar, Patrick Yin Chiang

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014