Thomas Ernst

According to our database, Thomas Ernst authored at least 10 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Ultra-High Sensitivity Silicon Nanowire Array Biosensor Based on a Constant-Current Method for Continuous Real-Time pH and Protein Monitoring in Interstitial Fluid.

Yann Sprunger, L. Capua, Thomas Ernst, S. Barraud, Adrian Mihai Ionescu, A. Saeidi

Proceedings of the 49th IEEE European Solid State Circuits Conference, 2023

2021

A Wearable Low-Power Sensing Platform for Environmental and Health Monitoring: The Convergence Project.

Elise Saoutieff, Tiziana Polichetti, Laurent Jouanet, Adrien Faucon, Audrey Vidal, Alexandre Pereira, Sebastien Boisseau, Thomas Ernst, Maria Lucia Miglietta, Brigida Alfano, Ettore Massera, Saverio De Vito, Do Hanh Ngan Bui, Philippe Benech, Tan-Phu Vuong, Carmen Moldovan, Yann Danlée, Thomas Walewyns, Sylvain Pétré, Denis Flandre, Armands Ancans, Modris Greitans, Adrian M. Ionescu

Sensors, 2021

Overcoming the Data Deluge Challenges with Greener Electronics.

Jean-René Léquepeys, Marc Duranton, Susana Bonnetier, Sandrine Catrou, Richard Fournel, Thomas Ernst, Laurent Hérault, D. Louis, A. Jerraya, Alexandre Valentian, François Perruchot, Thomas Signamarcheix, Elisa Vianello, Carlo Reita

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2017

Design considerations for optimization of pull-in stability margin in electrostatic N/MEM relays.

Giulia Usai, Louis Hutin, Jose Luis Muñoz-Gamarra, Thomas Ernst, Maud Vinet, Philip X.-L. Feng

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2015

Piezoresistive transduction optimization of p-doped poly-Silicon NEMS.

Issam Ouerghi, Willy Ludurczak, Laurent Duraffourg, Carine Ladner, Anouar Idrissi-El Oudrhiri, Patrice Gergaud, Maud Vinet, Thomas Ernst

Proceedings of the 45th European Solid State Device Research Conference, 2015

High performance NEMS devices for sensing applications.

Thomas Ernst, Sebastien Hentz, Julien Arcamone, Vincent Agache, Laurent Duraffourg, Issam Ouerghi, Willy Ludurczak, Carine Ladner, Eric Ollier, Philippe Andreucci, Éric Colinet, Pierre Puget

Proceedings of the 45th European Solid State Device Research Conference, 2015

2013

Impact of process variability on a frequency-addressed NEMS array sensor used for gravimetric detection.

Olivier Martin, Éric Colinet, Eric Sage, Cecilia Dupre, Patrick Villard, Sebastien Hentz, Laurent Duraffourg, Thomas Ernst

Proceedings of the European Solid-State Device Research Conference, 2013

2012

3-D Sequential Integration: A Key Enabling Technology for Heterogeneous Co-Integration of New Function With CMOS.

Perrine Batude, Thomas Ernst, Julien Arcamone, Gregory Arndt, Perceval Coudrain, Pierre-Emmanuel Gaillardon

IEEE J. Emerg. Sel. Topics Circuits Syst., 2012

2011

Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs.

Kiichi Tachi, Sylvain Barraud, Kuniyuki Kakushima, Hiroshi Iwai, Sorin Cristoloveanu, Thomas Ernst

Microelectron. Reliab., 2011

CELONCEL: Effective design technique for 3-D monolithic integration targeting high performance integrated circuits.

Shashikanth Bobba, Ashutosh Chakraborty, Olivier Thomas, Perrine Batude, Thomas Ernst, Olivier Faynot, David Z. Pan, Giovanni De Micheli

Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011