Thierry Parrassin

According to our database, Thierry Parrassin authored at least 3 papers between 2010 and 2011.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2011

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation.

Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet

Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.

Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2011

2010

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).

Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2010