Thierry Kociniewski

According to our database, Thierry Kociniewski authored at least 4 papers between 2013 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2015

Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions.

Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir

Microelectron. Reliab., 2015

Mechanical and thermal stresses characterization maps on cross-sections of forward biased electronic power devices.

Thierry Kociniewski, Zoubir Khatir

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

μ-Raman spectroscopy for stress analysis in high power silicon devices.

Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir

Microelectron. Reliab., 2014

2013

Distributed electro-thermal model of IGBT chip - Application to top-metal ageing effects in short circuit conditions.

Jeff Moussodji, Thierry Kociniewski, Zoubir Khatir

Microelectron. Reliab., 2013