Thibault Vayssade

According to our database, Thibault Vayssade authored at least 10 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Digital generation of single tone FM/PM test stimuli: a theoretical analysis.

K. Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme.

K. Tahraoui, R. Burelle, T. Vayssade, F. Lefevre, Laurent Latorre, Florence Azaïs

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing".

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

2021

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition.

T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.

Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the 26th IEEE European Test Symposium, 2021

Digital test of ZigBee transmitters: Validation in industrial test environment.

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

EVM measurement of RF ZigBee transceivers using standard digital ATE.

T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.

T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE.

T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018