Thiago Copetti

According to our database, Thiago Copetti authored at least 31 papers between 2012 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing.

Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls

J. Electron. Test., April, 2024

Understanding Transistor Aging Impact on the Behavior of RRAM Cells.

Seyed Hossein Hashemi Shadmehri, Supriya Chakraborty, Thiago Santos Copetti, Fabian Luis Vargas, Letícia Maria Bolzani Poehls

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs.

Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

2023

Evaluating a New RRAM Manufacturing Test Strategy.

Thiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs.

Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen

J. Electron. Test., 2021

Review of Manufacturing Process Defects and Their Effects on Memristive Devices.

Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke

J. Electron. Test., 2021

A DfT Strategy for Detecting Emerging Faults in RRAMs.

Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Bolzani Pöhls

Proceedings of the VLSI-SoC: Technology Advancement on SoC Design, 2021

Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs.

Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Veiras Bolzani

Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021

Evaluating the Impact of Process Variation on RRAMs.

E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Improving the Detection of Undefined State Faults in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.

Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

J. Electron. Test., 2020

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

J. Electron. Test., 2019

A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects.

Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Analysing NBTI Impact on SRAMs with Resistive Defects.

M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls

J. Electron. Test., 2017

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs.

Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen

Proceedings of the VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things, 2017

Analyzing the behavior of FinFET SRAMs with resistive defects.

Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

2016

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

J. Electron. Test., 2016

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.

Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas

J. Electron. Test., 2016

Analyzing NBTI impact on SRAMs with resistive-open defects.

M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls

Proceedings of the 17th Latin-American Test Symposium, 2016

Gate-level modelling of NBTI-induced delays under process variations.

Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar

Proceedings of the 17th Latin-American Test Symposium, 2016

2015

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG.

N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 16th Latin-American Test Symposium, 2015

NBTI-aware design of integrated circuits: a hardware-based approach.

Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the 16th Latin-American Test Symposium, 2015

SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

An On-Chip Sensor to Monitor NBTI Effects in SRAMs.

Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes

J. Electron. Test., 2014

Hierarchical identification of NBTI-critical gates in nanoscale logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti

Proceedings of the 15th Latin American Test Workshop, 2014

2012

Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM.

Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas

Proceedings of the 13th Latin American Test Workshop, 2012

On-chip aging sensor to monitor NBTI effect in nano-scale SRAM.

Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012