Theo Smedes

According to our database, Theo Smedes authored at least 14 papers between 2002 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

An integral injector-victim current transfer model for latchup design rule optimization.

Guido Quax, Theo Smedes

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2013

Pitfalls for CDM calibration procedures.

Theo Smedes, M. Polewski, A. van IJzerloo, Jean Luc Lefebvre, M. Dekker

Microelectron. Reliab., 2013

2011

On-chip system level protection of FM antenna pin with improved linearity.

Guido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes

Microelectron. Reliab., 2011

2010

ESD protection for thin gate oxides in 65 nm.

Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic

Microelectron. Reliab., 2010

2009

ESD testing of devices, ICs and systems.

Theo Smedes

Microelectron. Reliab., 2009

ESD robust high-voltage active clamps.

Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong

Microelectron. Reliab., 2009

An ESD test reduction method for complex devices.

Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller

Microelectron. Reliab., 2009

2007

Selecting an appropriate ESD protection for discrete RF power LDMOSTs.

Theo Smedes, J. de Boet, T. Rödle

Microelectron. Reliab., 2007

2005

A 3-D Circuit Model to evaluate CDM performance of ICs.

M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2005

2004

A case study of ESD failures at random levels: analysis, explanation and solution.

T. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom

Microelectron. Reliab., 2004

Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current.

F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps

Microelectron. Reliab., 2004

2003

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2003

A simple design methodology for increased ESD robustness of CMOS core cells.

Albert Jan Huitsing, Theo Smedes, H.-U. Schröder

Proceedings of the ESSCIRC 2003, 2003

2002

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002