Theano A. Karatsori

According to our database, Theano A. Karatsori authored at least 4 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs.

Krishna Pradeep, Theano A. Karatsori, Thierry Poiroux, Andre Juge, Patrick Scheer, Gilles Gouget, Emmanuel Josse, Gérard Ghibaudo

Proceedings of the 48th European Solid-State Device Research Conference, 2018

Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator.

Theano A. Karatsori, K. Bennamane, Christoforos G. Theodorou, L. Czornomaz, Jean Fompeyrine, Cezar B. Zota, Clarissa Convertino, Gérard Ghibaudo

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.

Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis

Microelectron. Reliab., 2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.

R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016