Tee Yi Wen
Orcid: 0000-0003-4564-4910
According to our database1,
Tee Yi Wen
authored at least 2 papers
between 2021 and 2022.
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Bibliography
2022
Hybrid Approach of EEG Stress Level Classification Using K-Means Clustering and Support Vector Machine.
IEEE Access, 2022
2021
Electroencephalogram Stress Classification of Single Electrode using K-means Clustering and Support Vector Machine.
Proceedings of the IEEE International Conference on Signal and Image Processing Applications, 2021