Ted Sun

According to our database, Ted Sun authored at least 2 papers in 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

A new statistical methodology predicting chip failure probability considering electromigration.

Ted Sun, Ayhan A. Mutlu, Mahmudur Rahman

Microelectron. Reliab., 2013

Statistical Electromigration analysis of a chip with the consideration of a within-die temperature map.

Ted Sun, Ayhan A. Mutlu, Mahmud Rahman

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013