Tao Chen

According to our database, Tao Chen authored at least 14 papers between 2015 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test.

Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen

IEEE Trans. Instrum. Meas., 2020

An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method.

Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen

IEEE Trans. Instrum. Meas., 2020

A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier.

Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez

IEEE Trans. Circuits Syst., 2020

2019

Built-in self-test and self-calibration for analog and mixed signal circuits.

Tao Chen, Degang Chen

Proceedings of the IEEE International Test Conference, 2019

2018

High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing.

Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen

IEEE Trans. Instrum. Meas., 2018

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.

Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME).

Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.

Yan Duan, Tao Chen, Degang Chen

J. Electron. Test., 2017

An on-chip ADC BIST solution and the BIST enabled calibration scheme.

Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen

Proceedings of the IEEE International Test Conference, 2017

2016

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.

Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Low-cost dithering generator for accurate ADC linearity test.

Yan Duan, Tao Chen, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

Ultrafast stimulus error removal algorithm for ADC linearity test.

Tao Chen, Degang Chen

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Effect of flicker noise on SEIR for accurate ADC linearity testing.

Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST.

Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015