Tanya Nigam

According to our database, Tanya Nigam authored at least 16 papers between 1999 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Robust Off-State TDDB Reliability of n-LDMOS.

Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Optimized LDMOS Offering for Power Management and RF Applications.

Salvatore Cimino, J. Singh, Jeffrey B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, Matthew Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area.

Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Self-heating characterization and its applications in technology development.

Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min

Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology.

Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.

M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, Jeffrey B. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Bias temperature instability in scaled CMOS technologies: A circuit perspective.

Andreas Kerber, Tanya Nigam

Microelectron. Reliab., 2018

Understanding gate metal work function (mWF) impact on device reliability - A holistic approach.

P. Srinivasan, Rakesh Ranjan, S. Cimino, A. Zainuddin, B. Kannan, L. Pantisano, I. Mahmud, G. Dilliway, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Material and device innovation impact on reliability for scaled CMOS technologies.

Tanya Nigam, Andreas Kerber, Tian Shen, Rakesh Ranjan, Linjun Cao

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2015

Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective.

Tanya Nigam, Andreas Kerber

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.

Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Reliability modeling of HK MG technologies.

Tanya Nigam, Andreas Kerber

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013

CMOS reliability: From discrete device degradation to circuit aging.

Tanya Nigam

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

2009

Impact of Transistor Level degradation on product reliability.

Tanya Nigam

Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

1999

Cost-effective cleaning and high-quality thin gate oxides.

Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke

IBM J. Res. Dev., 1999