Takuya Totsuka
According to our database1,
Takuya Totsuka
authored at least 2 papers
in 2015.
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Bibliography
2015
A study on HCI induced gate leakage current model used for reliability simulations in 90nm n-MOSFETs.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
Study on maximum electric field modeling used for HCI induced degradation characteristic of LDMOS transistors.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015