Takuya Sawada

According to our database, Takuya Sawada authored at least 11 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging.

Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo, Takuji Miki, Makoto Nagata

IEICE Trans. Electron., October, 2023

Semi-Supervised Learning Based De-Raining Method for UAV.

Takuya Sawada, Takafumi Katayama, Tian Song, Takashi Shimamoto

Proceedings of the IEEE International Conference on Consumer Electronics, 2023

2022

Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging.

Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Takuji Miki, Makoto Nagata, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2019

Character input system based on EMG signals generated by eye blinks.

Yoshiko Maruyama, Takuya Sawada, Kenji Moriya

Proceedings of the 7th ACIS International Conference on Applied Computing and Information Technology, 2019

2015

An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference.

Takuya Sawada, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata

IEEE Trans. Very Large Scale Integr. Syst., 2015

2014

A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation.

Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto

IEICE Trans. Electron., 2014

A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement.

Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

An insertion loss control method for supplementing cancellation effect deteriorated by echo path change in hands free telecommunication system.

Kensaku Fujii, Mitsuji Muneyasu, Takuya Sawada, Takuto Yoshioka, Masakazu Morimoto

Proceedings of the 2014 IEEE Asia Pacific Conference on Circuits and Systems, 2014

2013

A Step Size Control Method Improving Estimation Speed in Double Talk Term.

Takuto Yoshioka, Kana Yamasaki, Takuya Sawada, Kensaku Fujii, Mitsuji Muneyasu, Masakazu Morimoto

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2013

2012

Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation.

Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata

IEICE Trans. Electron., 2012

2011

Session Initiation Protocol (SIP) Usage of the Offer/Answer Model.

Shunsuke Okumura, Takuya Sawada, Paul H. Kyzivat

RFC, August, 2011