Takuji Miki
Orcid: 0000-0002-0168-3304
According to our database1,
Takuji Miki
authored at least 30 papers
between 2006 and 2024.
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Bibliography
2024
Proceedings of the 21st International SoC Design Conference, 2024
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips.
Proceedings of the Workshop on Fault Detection and Tolerance in Cryptography, 2024
Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection.
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection.
Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2024
2023
Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging.
IEICE Trans. Electron., October, 2023
An Analog Side-Channel Attack on a High-Speed Asynchronous SAR ADC Using Dual Neural Network Technique.
IEICE Trans. Electron., October, 2023
Proceedings of the IEEE International Solid- State Circuits Conference, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
IEEE Trans. Very Large Scale Integr. Syst., 2022
An 11-bit 0.008mm<sup>2</sup> charge-redistribution digital-to-analog converter operating at cryogenic temperature for large-scale qubit arrays.
IEICE Electron. Express, 2022
IEEE Des. Test, 2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
A Random Interrupt Dithering SAR Technique for Secure ADC Against Reference-Charge Side-Channel Attack.
IEEE Trans. Circuits Syst. II Express Briefs, 2020
Si-Backside Protection Circuits Against Physical Security Attacks on Flip-Chip Devices.
IEEE J. Solid State Circuits, 2020
2019
A 0.72pJ/bit 400μm<sup>2</sup> Physical Random Number Generator Utilizing SAR Technique for Secure Implementation on Sensor Nodes.
IEICE Trans. Electron., 2019
Proceedings of the IEEE Custom Integrated Circuits Conference, 2019
Over-the-top Si Interposer Embedding Backside Buried Metal PDN to Reduce Power Supply Impedance of Large Scale Digital ICs.
Proceedings of the 2019 International 3D Systems Integration Conference (3DIC), 2019
2017
A 2-GS/s 8-bit Time-Interleaved SAR ADC for Millimeter-Wave Pulsed Radar Baseband SoC.
IEEE J. Solid State Circuits, 2017
A 500 MHz-BW -52.5 dB-THD Voltage-to-Time Converter Utilizing Two-Step Transition Inverter Delay Lines in 28 nm CMOS.
IEICE Trans. Electron., 2017
2016
A 97.99 dB SNDR, 2 kHz BW, 37.1 µW noise-shaping SAR ADC with dynamic element matching and modulation dither effect.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
A 500MHz-BW -52.5dB-THD Voltage-to-Time Converter utilizing a two-step transition inverter.
Proceedings of the ESSCIRC Conference 2016: 42<sup>nd</sup> European Solid-State Circuits Conference, 2016
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2016
2015
A 1 mm Pitch 80 × 80 Channel 322 Hz Frame-Rate Multitouch Distribution Sensor With Two-Step Dual-Mode Capacitance Scan.
IEEE J. Solid State Circuits, 2015
IEEE J. Solid State Circuits, 2015
2014
12.4 A 1mm-pitch 80×80-channel 322Hz-frame-rate touch sensor with two-step dual-mode capacitance scan.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014
2013
Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013
2012
An 11-b 300-MS/s Double-Sampling Pipelined ADC With On-Chip Digital Calibration for Memory Effects.
IEEE J. Solid State Circuits, 2012
2009
Design methods for pipeline & delta-sigma A-to-D converters with convex optimization.
Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009
2006
Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, 2006