Takeshi Okagaki

According to our database, Takeshi Okagaki authored at least 3 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.

Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya

IET Circuits Devices Syst., 2018

2016

FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.

Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya

Proceedings of the ESSCIRC Conference 2016: 42^nd European Solid-State Circuits Conference, 2016

2015

An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.

Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii

Proceedings of the ESSCIRC Conference 2015, 2015