Takeshi Mitani

Orcid: 0000-0002-4228-1707

According to our database1, Takeshi Mitani authored at least 1 paper in 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2022
Influence of SiC epitaxial wafer quality on yield of 1.2kV SiC-DMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022


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