Takeshi Kadono
Orcid: 0000-0002-2600-6633
According to our database1,
Takeshi Kadono
authored at least 3 papers
between 2019 and 2022.
Collaborative distances:
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Bibliography
2022
Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH2P Molecular Ion Implantation.
Sensors, 2022
2020
Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers.
Sensors, 2020
2019
Proximity Gettering Design of Hydrocarbon-Molecular-Ion-Implanted Silicon Wafers Using Dark Current Spectroscopy for CMOS Image Sensors.
Sensors, 2019