Takeshi Asakawa

According to our database, Takeshi Asakawa authored at least 4 papers between 2001 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development.

Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa

J. Inf. Process. Syst., 2008

2003

BIST-oriented test pattern generator for detection of transition faults.

Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara

Syst. Comput. Jpn., 2003

2001

Using ATPG vectors for BIST test pattern generator.

Takeshi Asakawa, Kazuhiko Iwasaki

Syst. Comput. Jpn., 2001

Hybrid BIST Using Partially Rotational Scan.

Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001