Takayoshi Kubono

According to our database, Takayoshi Kubono authored at least 21 papers between 1999 and 2012.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2012

Effects of Shapes of Contact Surfaces on Break Arcs Occurring between Electrical Contacts in Which a Magnet is Embedded.

Naoya Takeshita, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2012

Position and Shape of Break Arcs Driven by Transverse Magnetic Field.

Tomoaki Sasaki, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2012

Arc Duration of Break Arcs Magnetically Blown-Out in a DC 450 V Resistive Circuit.

Hitoshi Ono, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2012

2011

Arc Duration and Rotational Frequency of Break Arcs Driven by Radial Magnet Field in a DC42 V Resistive Circuit.

Naoya Takeshita, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2011

Break Arcs Driven by Transverse Magnetic Field in a DC48 V/6-24 A Resistive Circuit.

Toru Sugiura, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2011

2010

Effect of Contact Materials of Ag/SnO₂ and Ag/ZnO on Rotational Motion of Break Arcs Driven by Radial Magnetic Field.

Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2010

Characteristics of Break Arcs Driven by Transverse Magnetic Field in a DC High-Voltage Resistive Circuit.

Tomohiro Atsumi, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2010

2009

Rotational Motion of Break Arcs Driven by Radial Magnetic Field in a DC Resistive Circuit.

Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2009

2008

Relationship between Arc Duration and Motion of Arc Spots for Break Arcs of Ag and Ag/ZnO Electrical Contacts.

Junya Sekikawa, Takumi Sugio, Takayoshi Kubono

IEICE Trans. Electron., 2008

Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit.

Junya Sekikawa, Naoki Moriyama, Takayoshi Kubono

IEICE Trans. Electron., 2008

Motion of Break Arcs Driven by External Magnetic Field in a DC42 V Resistive Circuit.

Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2008

2007

Dependence of Motion of Breaking Arc on Contact Separating Speed for Ag and Pd Contact Pairs in a DC42V Resistive Circuit.

Yoshinobu Nakamura, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2007

2006

Optical Observation of Arc Discharges between Electrical Contacts Breaking at Low Speed in DC42 V Resistive Circuit.

Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2006

Spectroscopic Temperature Measurement of Breaking Arcs Near Cathode and Anode Surfaces of Copper Contacts.

Naoki Moriyama, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2006

2005

Observations of the Eroded Surfaces and the Motion of Arc Spots at Each Breaking Operation of Silver Electrical Contacts.

Junya Sekikawa, Tetsuya Kitajima, Takayoshi Endo, Takayoshi Kubono

IEICE Trans. Electron., 2005

An Experimental Equation for Dependence of Duration of Breaking Arcs on Supply Voltage with Constant Circuit Resistance.

Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2005

Observation of Pips Formed on Ag/SnO₂ Contacts in DC14 V-21 A Resistive Circuit.

Yutaka Naito, Tomoya Ito, Ryo Yamazaki, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2005

Growth of Transferred Pip and Electrical Properties of AgCdO Make-Only Contacts in Resistive Circuit with DC 14 V and 42 V Power Supply.

Tomoya Ito, Ryo Yamazaki, Yutaka Naito, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2005

A Proposal on a New Algorithm for Volume Calculation Based on Laser Microscope Data.

Makoto Hasegawa, Masato Akita, Kazutaka Izumi, Takayoshi Kubono

IEICE Trans. Electron., 2005

Cathode and Anode Bright-Spot Behaviors of Breaking Arc between Electrical Contacts with Low Separating Speed.

Takayoshi Endo, Junya Sekikawa, Takayoshi Kubono

IEICE Trans. Electron., 2005

1999

A spectroscopic detecting system for measuring the temperature distribution of silver breaking arc using a CCD color camera.

Mitsuru Takeuchi, Takayoshi Kubono

IEEE Trans. Instrum. Meas., 1999