Takashi Aikyo

According to our database, Takashi Aikyo authored at least 30 papers between 1986 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

A Variability-Aware Adaptive Test Flow for Test Quality Improvement.

Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

2012

Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool.

Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo

IEICE Trans. Inf. Syst., 2012

2011

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing.

Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

IEICE Trans. Inf. Syst., 2011

2010

A Study of Capture-Safe Test Generation Flow for At-Speed Testing.

Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010

Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau.

Takashi Aikyo

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

2009

Small Delay Fault Model for Intra-Gate Resistive Open Defects.

Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.

Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

A Novel Approach for Improving the Quality of Open Fault Diagnosis.

Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

Diagnostic test generation for transition faults using a stuck-at ATPG tool.

Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu

Proceedings of the 2009 IEEE International Test Conference, 2009

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara

Proceedings of the 2009 International Conference on Computer-Aided Design, 2009

An Adaptive Test for Parametric Faults Based on Statistical Timing Information.

Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Estimation of Delay Test Quality and Its Application to Test Generation.

Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo

IPSJ Trans. Syst. LSI Des. Methodol., 2008

Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information.

Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki

IEICE Trans. Inf. Syst., 2008

Post-BIST Fault Diagnosis for Multiple Faults.

Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato

IEICE Trans. Inf. Syst., 2008

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.

Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo

IEICE Trans. Inf. Syst., 2008

Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.

Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja

Proceedings of the 13th European Test Symposium, 2008

2007

Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines.

Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

Timing-Aware Diagnosis for Small Delay Defects.

Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

Test Roles in Diagnosis and Silicon Debug.

Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera

Proceedings of the 16th Asian Test Symposium, 2007

Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines.

Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

Proceedings of the 16th Asian Test Symposium, 2007

2006

Test Data Compression of 100x for Scan-Based BIST.

Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo

Proceedings of the 2006 IEEE International Test Conference, 2006

Effective Post-BIST Fault Diagnosis for Multiple Faults.

Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

At-Speed Testing with Timing Exceptions and Constraints-Case Studies.

Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Takeo Kobayashi, Janusz Rajski, Bruce Swanson, Darryl Walters, Yasuo Sato, Toshiharu Asaka, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

2000

Issues on SOC testing in DSM area: embedded tutorial.

Takashi Aikyo

Proceedings of ASP-DAC 2000, 2000

1997

A Test Synthesis Approach to Reducing BALLAST DFT Overhead.

Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng

Proceedings of the 34st Conference on Design Automation, 1997

ATREX : Design for Testability System for Mega Gate LSIs.

Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1990

ASIC CAD system based on hierarchical design-for-testability.

Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1986

An Automatic Test Generation System for Large Scale Gate Arrays.

Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii

Proceedings of the Spring COMPCON'86, 1986