Takaki Yoshida

According to our database, Takaki Yoshida authored at least 5 papers between 1997 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

A New Solution to Power Supply Voltage Drop Problems in Scan Testing.

Takaki Yoshida, Masafumi Watari

IEICE Trans. Inf. Syst., 2004

2003

A New Approach for Low Power Scan Testing.

Takaki Yoshida, Masafumi Watari

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

MD-SCAN Method for Low Power Scan Testing.

Takaki Yoshida, Masafumi Watari

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

1999

Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits.

Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1997

An effective fault simulation method for core based LSI.

Takaki Yoshida, Reisuke Shimoda, Takashi Mizokawa, Katsuhiro Hirayama

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997