Taisuke Iwakiri

According to our database, Taisuke Iwakiri authored at least 2 papers between 2001 and 2002.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2002

Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.

Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.

Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001