Tai-Wook Kim

According to our database¹, Tai-Wook Kim authored at least 2 papers between 2012 and 2014.

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2014

Real-time critical dimension measurement of thin film transistor liquid crystal display patterns using optical coherence tomography.

[BibT_eX]

[DOI]

J. Electronic Imaging, 2014

2012

Novel, fast, edge-directed image reconstruction algorithm using a substepping system for critical-dimension measurement of glass panels.

[BibT_eX]

[DOI]

J. Electronic Imaging, 2012