Tahui Wang

According to our database, Tahui Wang authored at least 9 papers between 1986 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Interfacial-Layer Design for Hf1-xZrxO2-Based FTJ Devices: From Atom to Array.

H.-L. Chiang, J.-F. Wang, K.-H. Lin, C.-H. Nien, J.-J. Wu, Kuo-Yu Hsiang, C.-P. Chuu, Y.-W. Chen, X. W. Zhang, C. W. Liu, Tahui Wang, C. C. Wang, Min-Hung Lee, M.-F. Chang, C.-S. Chang, T. C. Chen

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2018

Correlation between SET-state current level and read-disturb failure time in a resistive switching memory.

P. C. Su, C. M. Jiang, C. W. Wang, Tahui Wang

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method.

Y. H. Liu, H. Y. Lin, C. M. Jiang, Tahui Wang, W. J. Tsai, T. C. Lu, K. C. Chen, Chih-Yuan Lu

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory.

T. W. Lin, S. H. Ku, C. H. Cheng, C. W. Lee, Ijen Huang, Wen-Jer Tsai, T. C. Lu, W. P. Lu, K. C. Chen, Tahui Wang, Chih-Yuan Lu

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2008

Effects of length scaling on electromigration in dual-damascene copper interconnects.

M. H. Lin, M. T. Lin, Tahui Wang

Microelectron. Reliab., 2008

2007

Effects of width scaling and layout variation on dual damascene copper interconnect electromigration.

M. H. Lin, K. P. Chang, K. C. Su, Tahui Wang

Microelectron. Reliab., 2007

2005

Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment.

M. H. Lin, Y. L. Lin, K. P. Chang, K. C. Su, Tahui Wang

Microelectron. Reliab., 2005

1993

Device and circuit simulation of anomalous DX trap effects in DCFL and SCFL HEMT inverters.

Tahui Wang, Sheng-Jyh Wu, Chimoon Huang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

1986

Theoretical Studies of Electronic Transport in Gallium-Arsenide Material and Devices Using an Ensemble Monte Carlo Method (Modeling)

Tahui Wang

PhD thesis, 1986