Taehwan Yoon
Orcid: 0000-0003-0305-375X
According to our database1,
Taehwan Yoon
authored at least 3 papers
between 1989 and 2024.
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Bibliography
2024
High Efficiency Variation-Aware SRAM Timing Characterization via Machine-Learning-Assisted Netlist Extraction.
IEEE Trans. Circuits Syst. II Express Briefs, March, 2024
2023
Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023
1989
Proceedings of the 13th Annual International Computer Software and Applications Conference, 1989